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Physical electronics devices and ics miscellaneous

Physical Electronics Devices and ICs

  1. Consider the following statements—
    1. The threshold voltage (VT) of a MOS capacitor decreases with increase in gate oxide thickness.
    2. The threshold voltage (VT) of a MOS capacitor decreases with increase in substrate doping concentration. Which of the statements given above are correct.
    1. 1 is FALSE and 2 is TRUE
    2. Both 1 and 2 are TRUE
    3. Both 1 and 2 are FALSE
    4. 1 is TRUE and 2 is FALSE
Correct Option: A

The threshold voltage of N-channel MOSFET is expressed by

VTN =
|Q’SD (max)|
-
Q’ss
+ φms + 2φfp
CoxCox

Where, VTN = Threshold voltage for N-MOSFET
Q’ss = Electronic charge perunit area
φms = Work function difference
φfp = Surface potential

e = Charge of electron
s = Permitivity
Na = Acceptor ion concentration
Cox =
ox
tox

tox = gate oxide thickness
Thus on increasing gate oxide thickness. Cox decreases which increase threshold voltage, VTN.
And the threshold voltage VTN of a MOS capacitor with increase in substrate doping concentration increases,
since VTN α √Na
Hence alternative (A) is the correct choice.



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